Attocube AttoAFM I Manuale utente

Version:

1.0

Modified:

February 2015

Products:

Atomic Force Microscope attoAFM I

User Manuals

Atomic Force Microscope

attoAFM I/MFM/KPFM

P5788

attocube systems AG, Königinstrasse 11 A, D - 80539 München Germany

Phone: +49 89-24208888 Fax: +49 89-24208890

E-Mail: info@attocube.com www.attocube.com

For technical queries, contact:

support@attocube.com

attocube systems office Munich:

Phone +49 89 2877 80915

Fax +49 89 2877 80919

Disclaimer of Responsibility

attocube systems does not assume any responsibility for the use of

any circuitry described in this manual. attocube systems reserves

the right to change the product specifications and the

functionality, or the manual itself, at any time without prior

notice. Furthermore, attocube systems assumes no responsibility

or liability for any misinformation, errors, or general inaccuracies

that may appear in this manual.

Product and company names listed are trademarks or trade names of

their respective companies. Any rights not expressly granted herein

are reserved.

Page 3

companies. Any rights not expressly granted herein are reserved. ATTENTION: Specifications and technical data are subject

to change without notice.

Table of Contents

I. Introduction .............................................................................................. 4

I.1. System Overview ..................................................................................... 5

I.1. Safety Information .................................................................................. 6

I.1.a. Warnings ............................................................................................7

II. Mode of Operation and Force Detection Scheme ................................................. 9

III. Components of the Microscope and Technical Specifications ................................12

III.1. Microscope Setup ...................................................................................12

III.2. Electronics............................................................................................14

III.2.a. ANC300: High voltage amplifier ............................................................. 14

III.2.b. ACC100: LDM1300 Laser Detector module and Break-Out Panels.................... 14

III.2.c. ANC350 Piezo controller for positioners................................................... 15

III.2.d. Laser detector module: LDM1300 ........................................................... 16

III.2.e. ASC500 SPM Controller ........................................................................ 16

III.3. (Dis-)Assembling the attoAFM I Module.......................................................17

III.3.a. Inserting (removing) the stack into (from) the microscope housing............... 17

III.3.b. Mounting the Scanner-Positioner Stack ................................................... 19

III.4. Sample Exchange and Thermal Contact........................................................19

III.5. Changing the AFM Cantilever.....................................................................20

III.5.a. The cantilever mounting platform .......................................................... 23

III.5.b. Cantilever exchange............................................................................ 23

III.5.c. Mounting the attoAFM I sensor head into the housing ................................ 26

IV. Connecting the attoAFM I Module ..................................................................27

IV.1. Electrical Connections .............................................................................27

IV.1.a. ASC500 Controller Connections.............................................................. 27

IV.1.b. Break-Out Panel Connections ................................................................ 28

IV.1.c. Pin Connections ................................................................................. 29

IV.1.d. Vacuum Feedthroughs ......................................................................... 31

IV.2. Fiber Connection ....................................................................................31

V. Measurement Procedure ..............................................................................32

V.1. Operation Modes ....................................................................................32

V.1.a. Contact Mode without Feedback (constant height)..................................... 32

V.1.b. Contact Mode with Feedback on (constant force) ....................................... 33

V.1.c. Non-Contact Mode .............................................................................. 33

V.1.d. MFM and EFM measurements ................................................................. 35

V.1.e. KPFM measurements............................................................................ 35

V.2. Performing a Scan ..................................................................................36

V.2.a. Set the Actor Scaling ........................................................................... 36

V.2.b. Non-Contact Mode .............................................................................. 37

V.2.c. Contact Mode..................................................................................... 43

V.2.d. Starting a scan................................................................................... 48

Page 4

I. Introduction

The attoAFM I is designed particularly for the use at extreme

environmental conditions such as ultra-low temperature, high magnetic

fields and high vacuum. Reliable functionality at these extreme conditions

is provided by implementing the outstanding attocube systems

nanopositioning modules as well as a force detection scheme based on an

all fiber low-coherence interferometer (explained in detail in the next

section).

To perform low temperature microscopy, the attoAFM I is cooled by a

controlled exchange gas atmosphere in a liquid Helium bath cryostat or a

variable temperature insert or a closed cycle cooling system.

The instruments may be surrounded by both liquid helium and liquid

nitrogen radiation shields, separated by vacuum insulation.

Figure 1

: The attoAFM I standard setup

Page 5

companies. Any rights not expressly granted herein are reserved. ATTENTION: Specifications and technical data are subject

to change without notice.

I.1. System Overview

The attoAFM I microscope is a tool to image, characterize, analyze, and

manipulate materials surfaces on a nanometer scale in low temperatures

as well as high magnetic fields. This short chapter wants to give a rough

overview on the concepts of the system.

The attoAFM I consists of the measurement head which is inside a housing

suspended on the lower end of the microscope stick, which itself is placed

in a vacuum tube. Before cooling down the system, this vacuum tube is

evacuated and backfilled with some He exchange gas for coupling to the

temperature outside of the vacuum tube. Typically, this vacuum tube is

then cooled by insertion into a He bath cryostat, a Variable Temperature

Insert (VTI), a pulse tube cooler, or by other means.

The main part of the attoAFM I measurement head is the AFM cantilever, a

thin bar typically made from silicon and possibly functionalized with

different coatings, which is placed before the end of an optical fiber,

hence forming an optical cavity, the length of which can be measured by

a laser/detector system.

The sample to be examined is placed (in standard setups) on an

ANPxyz101 positioner stack for coarse motion (5 x 5 x 5 mm³) and an

ANSxyz100 scanner (typ. 30 x 30 x 15 µm³ at 4 K, for details see the

specifications page at the end of the manual). Just underneath there is

typically also a temperature sensor and a small heater, which allows

controlling the temperature of the sample precisely.

When the sample is brought into contact with the cantilever, the

interaction forces can be measured by recording the length of the cavity.

While the sample is scanned, typically the distance between -tip and

sample is kept constant by the use of a feedback loop. For these purposes,

one uses the electronic scan controller ASC500, which generates all

required voltages and records all relevant signals. Additionally, a high

voltage amplifier ANC300 is part of the system, amplifying the unipolar,

0 –10 V signals to 0 –150 V, as well as generating the signals required to

move the stepper positioners.

Regarding the optics, laser light is guided to the fiber-cantilever cavity,

and the back-reflection is then detected by a photo-receiver. The signal

generated by the photo-receiver is analyzed and recorded with the

ASC500 controller.

Page 6

I.1. Safety Information

For the continuing safety of the operators of this equipment and the

protection of the equipment itself, the operator should take note of the

Warnings, Cautions, and Notes throughout this handbook and, where

visible, on the product itself.

The following safety symbols may be used on the equipment:

Laser safety warning. Class 1M laser product.

Warning. Risk of electric shock. High voltages present.

Warning. Risk of danger. Refer to the handbook for details on this hazard.

Functional (EMC) earth/ground terminal.

The following safety symbols may be used throughout the handbook:

Warning. An instruction, which draws attention to the risk of injury or

death.

Caution. An instruction, which draws attention to the risks of damage to

the product, process, or surroundings.

Note. Clarification of an instruction or additional information.

Page 7

companies. Any rights not expressly granted herein are reserved. ATTENTION: Specifications and technical data are subject

to change without notice.

I.1.a. Warnings

Note: Please read the manual for the positioners, scanners, and the

controllers prior to initial operation! Mind the warnings mentioned in

there!

Warning. To prevent electrical shocks do not remove the cover of the

control unit. Unplug the power cord and all other electrical connections

and consult qualified service personnel before servicing or cleaning.

Operate only under dry conditions and at room temperature.

Warning. If this equipment is used in a manner not specified by the

manufacturer, the protection provided by the equipment may be impaired.

Do not operate the instrument outside its rated supply voltages or

environmental range. In particular, excessive moisture may impair safety.

Warning. Any individual vacuum space must be equipped with a security

overpressure valve! In case of hidden leaks air may enter into vacuum

spaces and build up large amounts of condensate at cold walls and

interfaces. In case such system is warmed up again such ice may evaporate

quickly and easily build up extremely dangerous overpressures! If no

overpressure valve is mounted on such vacuum space or the valve is

blocked e.g. due to mounting to a recovery line, this overpressure may

cause sudden breakdowns of the container, i.e. explosions. If in doubt,

please contact attocube systems.

Laser Safety Warning. Class 1M Laser product. This device utilizes a laser

which emits invisible light. There is potential for eye damage if proper

caution is not taken. The laser assembly should not be modified in any

way. The fiber cable should never be disconnected from the laser device

for any reason. The laser's wavelength is specified at 1330 nm with a

maximum power output of 1.5 mW. Please wear protective eyewear when

the laser source is turned on and never look directly into to the laser port

or fiber.

Warning. Plugging or unplugging modules of the electronic while

connected to power line will cause damages to the electronic. For

replacing modules disconnect the electronics from power and wait at least

5 minutes. Internal components need to be discharged.

Page 8

Caution. Never connect any cabling to the electronics when contacts are

exposed! Never connect any cabling to the electronics when the

electronics is not in GND mode! The scan piezos at the heart of a positioner

unit are high voltage components and can cause serious injuries. Be

careful not to cause a short-cut between the contacts in the BNC or any

other connectors.

Caution. For laboratory use only. This unit is intended for operation from a

normal, single phase supply, in the temperature range 5° to 40°C, 20% to

80% RH. The unit must be connected only to an earthed fused supply of

100, 115 or 230 V, 50/60 Hz.

Caution. In case of failure refer to your local dealer or attocube systems.

Users are cautioned not to attempt to access, open, modify, or service any

part of the setup unless outlined herein or otherwise directed by the

technical support staff from attocube systems. Take special care if

connecting products from other manufacturers. Clean only with a dry

cloth.

Caution. Because of the inherent fragility of the positioners and scanners

and the extreme conditions they are operated in, no responsibility can be

taken by the manufacturer for breakdowns of the ceramic piezo stacks. In

case of breakage, please contact the manufacturer for details of the repair

service.

Page 9

companies. Any rights not expressly granted herein are reserved. ATTENTION: Specifications and technical data are subject

to change without notice.

II. Mode of Operation and Force Detection Scheme

The attoAFM I is an atomic force microscope built around an optical

fiber based interferometer. The sensor is compatible with any

commercial cantilever and measures the vertical deflection of the

cantilever with picometer resolution. The microscope is designed to

work both in contact and in non-contact mode.

This highly compact microscope guarantees highest resolution tip-

sample positioning and an optimized sensor adjustment suitable for

any environment: room or low temperature, high magnetic field or

high vacuum conditions.

Figure 2

: Schematic drawing of the attoAFM I system.

Page 10

The force detection scheme for the attoAFM I microscope system is

based on an all fiber low-coherence interferometer (seeFigure 3).

Via a 50/50 fiber coupler, a laser beam illuminates a cavity built up

from the end-face of the fiber and the back-face of the cantilever. The

light reflected back from these surfaces gives rise to interferences that

can be seen by a detector. Due to the low reflectivity constants these

surfaces form a low-finesse Fabry-Perot cavity.

Monitoring the intensity of the interference fringes allows measuring

the tip deflection. The low coherence of the laser source has the

advantage of eliminating spurious interference signals resulting from

other reflections in the setup (e.g. the coupler), thus leading to an

increase of the signal-to-noise ratio of about 30 dB.

Figure 3

: Schematic drawing of the AFM I setup.

The periodicity of the signal corresponds to half the wavelength of the

laser source. Hence, the system can be easily calibrated and a measured

voltage difference can be translated into a height difference.

The control fiber has to be adjusted with respect to the cantilever in such a

way that the interference signal is at the quadrature point, i.e. in the

middle between two extrema values. In this case, the sensitivity of the

sensor is highest.

There are different ways to perform topographic images. Common modes

are the so-called contact- and non-contact modes.

Indice

Manuali Microscopio popolari di altre marche

Thermo Scientific

Thermo Scientific Nicolet iN10 Guida

National

National DC3-163 Manuale utente

KERN Optics

KERN Optics OPE-1 Manuale utente

OPTIKA MICROSCOPES

OPTIKA MICROSCOPES B-150D Manuale utente

Prior

Prior Lux POL Manuale utente

Opitec

Opitec Smartscoop 115615 Manuale utente

KERN

KERN OPO-1 Manuale utente

Topcon

Topcon SP-1P Manuale utente

Motic

Motic PA43 Manuale utente

Leica

Leica DVM5000 Guida utente

MshOt

MshOt MZ62 Manuale utente

KERN Optics

KERN Optics OZR-5 Manuale utente

VWR

VWR VisiScope 384 Series Manuale utente

Nikon

Nikon ECLIPSE E200 POL Manuale utente

Leica

Leica DI C800 Manuale

ThermoFisher Scientific

ThermoFisher Scientific Continuµm Manuale utente

ThermoFisher Scientific

ThermoFisher Scientific Continuµm Manuale utente

Olympus

Olympus SZ61 Manuale utente

attocube attoAFM I Manuale utente

Manuali Microscopio popolari di altre marche