Metek Apollo XF Octane Manuale utente

Apollo XF/XLT/Octane

Basic User

Guide

Rev. 1.5

June 24, 2016

Octane Basic User Guide

Page 2 of 25

The Apollo XF, Apollo XLT and Octane detectors are manufactured by:

EDAX, a business unit of Ametek, Inc. Materials Analysis Division

91 McKee Drive

Mahwah, NJ 07430

USA

(201) 529 - 4880

edax.support@ametek.com

 Contents 
Octane Basic User Guide 
Page 3 of 25 
 
Table of Contents 
Introduction .......................................................................................................................................... 5 
1 Detector Types.............................................................................................................................. 5 
Safety Precautions ................................................................................................................................ 7 
1 High Voltages ................................................................................................................................ 7 
2 Not Hot Swappable ....................................................................................................................... 7 
3 Cooling .......................................................................................................................................... 7 
4 Motorized Slide............................................................................................................................. 7 
5 Radiation safety ............................................................................................................................ 8 
6 Extending Detector Window Life .................................................................................................. 8 
6.1 Do not allow the detector to come into close proximity or contact with high voltage 
components .......................................................................................................................................... 8 
6.2 Prevent particle contamination inside the sample chamber................................................ 9 
6.3 Proper care when using a compressed gas to vent the sample chamber ............................ 9 
6.4 Avoid hitting the detector or inducing mechanical vibrations in the detector or SUTW ..... 9 
6.5 Avoid touching the window ................................................................................................ 10 
6.6 When not in use leave the SEM in high vacuum mode ......................................................10 
6.7 Do not expose the detector to extreme temperatures ...................................................... 10 
6.8 Do not expose the SUTW to plasma ...................................................................................10 
6.9 Windowless detectors.........................................................................................................10 
Installation and Environment Requirements...................................................................................... 11 
1 Power requirements ................................................................................................................... 11 
2 Space and Weight specifications ................................................................................................ 11 
3 Environment requirements.........................................................................................................11 
Basic Detector Operation.................................................................................................................... 13 
1 Startup ........................................................................................................................................ 13 
2 Detector Cooling .........................................................................................................................13 
2.1 Status LEDs.......................................................................................................................... 14 
2.2 Using an Octane detector with TEAM software .................................................................15 
2.3 Using an Octane detector with Genesis Software .............................................................. 16 
3 Motorized Detector .................................................................................................................... 17 
4 Adding to company network....................................................................................................... 17 
5 Light Element Operation.............................................................................................................18 
6 Frequently Asked Questions (FAQ)............................................................................................. 18 
Basic System Cabling........................................................................................................................... 19 
1 Typical Workstation configuration.............................................................................................. 19 
2 Typical Microscope System configuration (SG-2) .......................................................................20 
3 Typical Dual Detector Microscope System configuration...........................................................21 
4 Typcial Microscope System Interconnect (SG-3) ........................................................................22 
Troubleshooting..................................................................................................................................25 
1 Remote Diagnostics ....................................................................................................................25 
2 Detector Problems ......................................................................................................................25 
 

Contents

Octane Basic User Guide

Page 4 of 25

This page is intentionally left blank

Introduction

Octane Basic User Guide

Page 5 of 25

1INTRODUCTION

The detector is a sophisticated precision instrument.

Removal of any system’s covers must be done by

qualified EDAX Factory trained engineers or

representatives.

All User / Operator adjustments and calibrations are done within the TEAM or Genesis software

environment. Users of the system should not attempt removing any covers or making any service

adjustments.

Proceed with caution where the following label is found.

Please send feedback regarding this manual to:

edax.suppo[email protected]

1.1 DETECTOR TYPES

The detectors listed in the table below are covered by this basic user guide. Note that a “W” in the

detector part number on the label, indicates the detector is a Window-less detector.

Name

Description

Octane Pro

10 mm2SUTW for SEM

Octane Plus

30 mm2 SUTW for SEM

Octane Super

60 mm2 SUTW for SEM

Octane Ultra

100 mm2SUTW for SEM

Apollo XF

60 mm2 SUTW for SEM

Octane Prime1

10 mm2SUTW for SEM

Apollo XLT

30 mm2 SUTW for TEM

Apollo XLT2

30 mm2 SUTW for TEM

Apollo XLT W

30 mm2Windowless for TEM

Apollo XLT Light Shield

30 mm2Windowless w/Light shield for TEM

Apollo XLT2 W

30 mm2 Windowless for TEM

Apollo XLT2 Light Shield

30 mm2Windowless w/Light shield for TEM

Octane T Ultra W

100 mm2Windowless for TEM (Racetrack)

Octane T Optima - 30

30 mm2 Windowless for TEM

Octane T Optima - 60

60 mm2 Windowless for TEM

Octane T Plus

30 mm2 SUTW for TEM

Table 1 - Detector models

See Technical specifications for differences from Octane Pro and limitations

Removing any of the instrument

covers, may pose a safety hazard as high

voltages may be exposed.

Do not attempt to use until fully

understanding its proper connections and

functions. Users should have a basic

understanding of the operation of the

system before operating.

Introduction

Octane Basic User Guide

Page 6 of 25

This page is intentionally blank

Safety Precautions

Octane Basic User Guide

Page 7 of 25

2SAFETY PRECAUTIONS

Use the following safety guidelines to help ensure personal safety and to help protect the detector

system from potential damage.

2.1 HIGH VOLTAGES

Exercise extreme caution where this label is found. High Voltage is present and can cause burn,

shock and/or cause serious injury.

There is circuitry in the detecting unit that generates high voltage (200 VDC) required to

bias the detector. Terminals carrying these voltages may be exposed when covers or panels are

removed.

2.2 NOT HOT SWAPPABLE

The electronics are NOT hot swappable unless otherwise specified. The power to the system must

be turned off before inserting or removing any of the modules, boards or any of the interconnecting

cables. If this precaution is not taken, component will be damaged nearest to the connecting pins.

2.3 COOLING

The detecting unit is cooled by the detecting unit body’s heat sink fins. No fans are used, just

ambient cooling via the heat sinks. Be sure these heat sinks are not blocked or covered. Keep away from

heat radiators or other heat sources. The detectors may fail if used in an enclosure with inadequate air

cooling.

2.4 MOTORIZED SLIDE

Warning! Pinch Hazard!

Fingers may be squeezed when operating the detector optional motorized slide.

□Do not place fingers or hands near the detector when operating the motorized slide.

Safety Precautions

Octane Basic User Guide

Page 8 of 25

2.5 RADIATION SAFETY

The electron microscope generates ionizing radiation when the electron beam is energized. The

detector is designed to have radiation leakage far less than the allowable level when properly mounted

with all covers and shielding in place.

EDAX warrants that its detectors and microscope interfaces when assembled and installed per EDAX

Engineers or Representatives, will provide Radiation Safety performance levels that will be in

compliance with the original Microscope design specifications.

Removal of any of the system's covers must be done by qualified EDAX Factory trained service engineers

or representatives. Opening covers or bypassing interlocks may expose users to radiation.

If the EDAX detector is removed from the microscope, it should be replaced by the original blanking port

cover provided by the microscope vendor.

Modification of covers or shielding or use of any other material than provided by EDAX or the

microscope vendor must be reviewed by a certified radiation expert and EDAX Inc. before use.

Caution: The radiation levels should be checked around the instrument after any service in which

covers or any radiation containment parts were removed.

2.6 EXTENDING DETECTOR WINDOW LIFE

Introduction

Super Ultra-Thin Windows (SUTW) for EDS detectors were introduced to the EDS market several years

ago to improve the transmission of low energy X-rays (e.g. B, C, N, O) through the window. The SUTW is

constructed of a 300 nm thick polymer foil with an additional 40 nm of coatings to reduce visible light

transmission and permeability. The polymer window is stretched over a silicon grid which provides

support over larger areas. The goal of the window is to allow signal X-rays to pass through to the

detector component while providing a hermetic seal on the atmosphere surrounding the detection

element. While the SUTW serves its intended purpose very well, it can be damaged if care is not taken

by users of the EDS system into which the window is installed.

Recall that the overall window thickness is approximately 340 nm, which is 150 times thinner than the

average human hair. When the window is damaged, this contaminates the atmosphere surrounding the

X-ray detector which in turn can degrade detector performance or cause failure. Damage to the SUTW

can be caused by physical contact, excess vibration, exceeding pressure or temperature specifications,

vapor condensation, electrical discharge to the detector or other factors.

2.6.1 DO NOT ALLOW THE DETECTOR TO COME INTO CLOSE PROXIMITY OR CONTACT

WITH HIGH VOLTAGE COMPONENTS

Do not allow the detector to come into close proximity or contact with high voltage components inside

the electron microscope, e.g. the extraction grid of a video detector. This can lead to an unsafe electrical

discharge to the detector which may damage the window.

Safety Precautions

Octane Basic User Guide

Page 9 of 25

2.6.2 PREVENT PARTICLE CONTAMINATION INSIDE THE SAMPLE CHAMBER

Particulates inside the sample chamber have a tendency to become entrained in the gas flow while

venting the sample chamber. The gas flow during a chamber vent or increase in chamber pressure is

generally turbulent meaning that entrained particles can fly in all directions, including toward the

detector window. Particulates which impact the window can cause micro cracks compromising the

vacuum seal of the window. In more extreme situations, particles can fully penetrate the window

causing what is known as a “bullet hole”, which causes a larger leak in the detector. It is also possible to

dislodge particles from the sample via the electron beam. If these particles are charged, they may be

accelerated toward the detector, which is at ground potential.

Recommendations:

• Always use particle free gloves when loading samples or working in the sample chamber.

• Be certain that there are no loose particles on the sample before placing the sample in the chamber.

Sample surfaces, fractures and powdered samples stuck to an adhesive should be cleaned with

compressed air to ensure the surfaces are clean and free of loose particles.

• Avoid venting the sample chamber too quickly. Specifically, do not exceed 10 cm/s gas velocity into

the chamber, as this can increase the risk of particle-induced detector window damage. This may

require a small aperture in the vent port or decrease in supply pressure if N2 purge is used to reduce the

gas velocity.

• If there is a high risk of particulates becoming dislodged during some operation in the microscope,

fully retract the detector to minimize the risk of damaging the detector window.

2.6.3 PROPER CARE WHEN USING A COMPRESSED GAS TO VENT THE SAMPLE CHAMBER

Ensure that the gas pressure does not exceed 2 atm.

Recommendations:

• Release any latching mechanism that is designed to keep the chamber door closed.

• Make certain that the chamber door will open normally when the chamber reaches atmospheric

pressure.

• Avoid venting the chamber too quickly as this can cause unsafe pressure-induced vibrations on the

window. See recommendations in section 2.6.2 above.

2.6.4 AVOID HITTING THE DETECTOR OR INDUCING MECHANICAL VIBRATIONS IN THE

DETECTOR OR SUTW

The SUTW can be ruptured by excessive physical vibration or shock.

Recommendations:

• Be careful not to run samples into the EDS detector.

• Close the sample chamber door gently.

• Do not pull the sample chamber door open while venting the sample chamber. This may lead to unsafe

pressure fluctuations inside the sample chamber which could damage the detector window.

Safety Precautions

Octane Basic User Guide

Page 10 of 25

2.6.5 AVOID TOUCHING THE WINDOW

Recommendations:

• Exercise extreme caution when working near the SUTW. The collimator provides a physical barrier to

protect the SUTW. Do not work with tools near the SUTW.

• If it is necessary to remove the collimator, the collimator should be removed and installed by a trained

technician so as not to touch the window or stress the end cap tip.

• Do not direct pressurized gas or liquid streams at the SUTW, for example in an attempt to clean the

SUTW.

• If necessary to clean the microscope chamber, retract or remove the detector using extreme caution

not to bump the detector tip or collimator.

2.6.6 WHEN NOT IN USE LEAVE THE SEM IN HIGH VACUUM MODE

If possible, leave the SEM in High Vacuum mode instead of in low vacuum or wet mode.

2.6.7 DO NOT EXPOSE THE DETECTOR TO EXTREME TEMPERATURES

Be mindful of conditions which may cause vapor condensation on the window or may cause the

temperature at the window to exceed manufacturer’s specifications. This may occur during a

microscope chamber bake or operation of a heat stage.

Recommendations:

• If there is a possibility that the sample may emit vapors while in the sample chamber, especially vapors

acidic or alkaline in nature, fully retract the EDS detector to minimize the risk of condensation on the

detector window.

• Take care when using a heating stage to follow manufacturer’s guidelines. Prior to using the heat

stage, confirm the EDS detector window type and temperature specifications as well as the heat load on

the EDS window during operation of the heating stage.

• The maximum temperature specification on Moxtek AP3 windows is not to exceed 40°C with 1 atm

differential or 70°C with zero pressure differential on the window.

2.6.8 DO NOT EXPOSE THE SUTW TO PLASMA

The window manufacturer of the SUTW does not recommend exposing the window to a plasma

generated by a plasma cleaner.

2.6.9 WINDOWLESS DETECTORS

Care should be taken to allow the detector to warm before venting the microscope to air. Failure

to do so may damage the detector module.

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