
6
input frequency by two, but more importantly, delivers complementary voltage
outputs at pins 15 of 1C1 (Q) and 14 (not-Q).
These complementary outputs are connected to indicators LED1 and LED2 via current-
limiting resistor R3. The LED's are arranged so that when the polarity across the
circuit is one way, only one LED will be illuminated, and when the polarity is the
reverse of that, the other LED is illuminated. Thus, when no transistor is being tested,
the LEDs flash alternately. The IC2 complementary outputs are also connected to
resistor network R4 and R5. The junction of these two resistors is connected to the
base of the transistor being tested.
With a good transistor connected to the B, C and E (Base, Collector and Emitter) clips,
when the correct voltage is applied to the three connectors, the transistor will turn on.
This produces a short circuit across the LED pair. For example, when a PNP transistor
is under test, during the interval when the Q output is low and the Q (not-Q) output is
high, the PNP device will turn on. In this mode, LED1 is shorted, LED2 is reverse
biased and, for that half cycle, neither LED will be illuminated. On the next half cycle,
the conditions of Q and not-Q are reversed with Q high and not-Q low. Under these
conditions, LED1 is off because it is reverse biased, and since the PNP transistor is cut
off, it does not prevent LED2 from being illuminated. Thus, when testing a good PNP
transistor, LED2 will flash, and when testing a good NPN type, LED1 will flash.
If the transistor under test is open circuit, both LEDs will flash. If the transistor has an
internal collector-to-emitter short circuit, neither LED will flash.
To compensate for low-valued resistors that may be present in the circuit being
tested, R4 is selected to supply a large amount of base current to the transistor under
test. This makes it possible to overcome in-circuit resistances across the collector-
base or base-emitter junctions of as little as 40 ohms.
Diodes D1 through D4 become important if the transistor being tested has an internal
short between its collector-base or base-emitter junctions. In such a case, half of the
transistor acts like a diode and would normally conduct and indicate a good transistor.
To overcome the possibility of this type of problem occurring, diodes D1 through D4
are added in series with the collector.