Abi Professional ChipMaster Compact Manuale utente

ChipMaster Compact Digital IC Tester

CHIPMASTER COMPACT PROFESSIONAL

DIGITAL IC TESTER

OPERATOR’S MANUAL

CHIPMASTER COMPACT PROFESSIONELL

DIGITALER IC-TESTER

BEDIENUNGSANLEITUNG

CHIPMASTER COMPACT PROFESSIONNEL

TESTEUR DIGITALE DE CI

MANUEL D’UTILISATION

ChipMaster Compact Digital IC Tester

CONTENTS

1. introduction - english 1

2. DC input 1

3. battery eliminator 2

4. switching on 2

5. operating modes 3

6. entering test numbers 3

7. testing the IC 4

8. test results 4

9. testing further ICs 6

10. continuous testing 6

11. search mode 7

12. self test mode 7

13. CompactLink mode 8

14. specifications 9

15. Einführung - deutsch 10

16. Stromversorgung 10

17. Netzteil 11

18. Einschalten 11

19. Betriebsarten 12

20. Eingabe der IC-Nummern 12

21. Testen des ICs 13

22. Testergebnisse 13

23. Testen weiterer ICs 15

24. Fortlaufendes Testen 15

ChipMaster Compact Digital IC Tester

25. Suchmodus 16

26. Selbstdiagnosemodus 17

27. CompactLink-Modus 17

28. Spezifikation 18

29. introduction - français 19

30. alimentation continue (DC) 19

31. éliminateur de piles 20

32. mise sous tension 20

33. modes d’operation 21

34. introduction des numéros de CI 21

35. test d’un CI 22

36. résultats 22

37. test de plusieurs CI 24

38. test en continu 24

39. mode de recherche 25

40. mode test de démarrage 25

41. CompactLink mode 26

42. specifications 27

43. IC support list/ IC Liste/ Liste des CI soutenus 28

43.1. introduction/Einführung/introduction 28

43.2. series 54/74 TTL ICs 28

43.3. CMOS ICs 30

43.4. memory ICs 31

43.5. interface, peripheral, microprocessor and LSI ICs 32

43.6. notes on TTL ICs 34

43.7. notes on CMOS ICs 34

43.8. notes on memory ICs 35

ChipMaster Compact Digital IC Tester

43.9. notes on interface ICs 35

43.10. Anmerkungen für TTL ICs 36

43.11. Anmerkungen für CMOS ICs 36

43.12. Anmerkungen für Memory ICs 36

43.13. Anmerkungen für Interface ICs 37

43.14. notes sur CI TTL 37

43.15. Note sur CMOS CI 38

43.16. note sur memoire CI 38

43.17. notes sur interface CI 38

ChipMaster Compact Digital IC Tester

Page 1

1. introduction - english

Thank you for purchasing the ABI

ChipMaster Compact Professional

Digital IC Tester.

The basic function of the ChipMaster

Compact Professional is to test a

digital IC for correct logical functioning

as described in the truth table and/or

function table. The ChipMaster

Compact applies the necessary signals to the inputs of the IC,

monitoring the outputs at each stage and comparing them with the

expected states. Any discrepancy results in a FAIL indication and the

faulty pins are shown on the integral display. Additional facilities are also

provided, amongst them test loops that can be used for goods inwards

inspection, detecting intermittent faults or simply providing a rapid

method of exercising any IC for demonstration or educational purposes.

Since the ChipMaster Compact contains an extensive IC library, it is not

necessary to program the unit yourself other than to key in the IC

number. It is also capable of identifying an unknown IC using the

SEARCH mode - this is a feature that many users will find extremely

valuable.

The ChipMaster Compact Professional is provided with an RS-232

interface enabling it to be connected to a companion software package

called CompactLink running on a PC. CompactLink allows test

programmes for ICs not included in the internal library to be developed

and downloaded into the ChipMaster Compact memory to enhance the

library according to your wishes.

2. DC input

The ChipMaster Compact is powered by four AA batteries or by the use

of the battery eliminator input at the rear of the case. To insert the

batteries, turn the unit upside down and remove the battery cover by

removing the two cross head screws holding it in place. The batteries

must be inserted in the correct orientation, as indicated by the drawing

within the battery compartment. Incorrect insertion of batteries will not

allow the unit to operate. Replace the battery cover and insert the

screws. If the battery voltage falls too low, a low battery warning symbol

will be displayed at the top left hand cell of the display in normal

ChipMaster Compact Digital IC Tester

Page 2

operating mode. A low battery warning will also be displayed during a

result display. Test results may be inconsistent under these conditions.

3. battery eliminator

An external battery eliminator is available for prolonged use of the

ChipMaster Compact. Many bipolar LSI ICs consume a large amount of

current when powered up, and battery life can be conserved by using the

eliminator. There is no need to remove the batteries prior to inserting

the battery eliminator. However, please note that during prolonged

periods of non-use batteries are prone to leakage and should be

removed. Note that to avoid damage to the unit we strongly advise that

you only use the recommended battery eliminator that is available by

contacting your distributor. Note that using an incorrect battery

eliminator voltage may damage the unit and invalidate the warranty.

4. switching on

To switch the unit on, simply press the 'ON' key. To preserve battery

life, the unit powers itself off after approximately 3 minutes of non-use or

when “Sw Off” is selected from the main menu. When the unit is

switched on, it first performs a self-diagnosis test. Therefore, before

switching on, check that the test socket is empty to prevent interference

with the diagnostics. If the unit passes the self-test, a pass result will be

displayed on the screen. Press a key to enter the main operating mode

- the display will be as follows:

When this initial display is obtained the ChipMaster Compact is ready for

use. If, however, the message SELF-TEST FAIL: is displayed along

with a fault message, this indicates that a self-test diagnostic fault has

been detected. Any detected faults will be displayed one at a time.

Pressing the TEST/EXEC key will then revert to the opening menu as

above, but of course operation of the unit will then be suspect. Before

contacting your distributor, check that the test socket is completely

empty.

NO:

MODE:Single:RDY

ChipMaster Compact Digital IC Tester

Page 3

5. operating modes

The ChipMaster Compact has a number of test modes that are selected

using the MODE/CLEAR key from the initial screen. The test modes are

as follows:

Single - execute a single test on the IC in the socket.

Loop - execute test repeatedly, regardless of the result.

P Loop - execute test repeatedly, provided the result was PASS.

F Loop - execute test repeatedly, provided the result was FAIL.

Search - identify the number of the IC in the socket.

Diags - execute the diagnostic self-test.

CmLink - enter remote mode for CompactLink software.

Sw Off - turn off the unit.

6. entering test numbers

Press the MODE/CLEAR key until the desired test mode is displayed.

Enter the number of the IC you wish to test. Pressing the

MODE/CLEAR key will clear the last digit from the display if a mistake is

made.

Note: The NUMERIC information only is entered, leaving out the

manufacturers prefixes and suffixes and IC family information. As

an example, all the following TTL ICs should be entered as 7, 4, 0, 0

on the keypad:

e.g. DM74LS00J, N74LS00N, N74S00N, N7400N, 74ALS00N,

SN74HCT00

A very small number of ICs have differing pin-outs for different IC

families - in these cases, the most popular pin-out only is supported.

The CMOS 4000 series is also supported and the IC numbers for this

family should all begin with "4", so that with for example Motorola ICs

beginning MC14... the initial "1" should be omitted. The same principles

apply also to memory ICs, which are mostly four digit numbers. With

interface ICs of the 8T series the "T" should be omitted. A complete list

of all ICs supported by the ChipMaster Compact is contained in the IC

SUPPORT LIST at the end of this manual together with notes on any

special requirements for certain ICs.

Note that if you have stored a user library using CompactLink, an IC in

the user library with the same number as one in the internal library will

take precedence. This allows a new test to be written for an existing IC.

ChipMaster Compact Digital IC Tester

Page 4

If you wish both tests to be available, use a different number for your

user test.

7. testing the IC

Insert the IC to be tested in the front of the 40 pin Zero Insertion Force

socket with pin 1 towards the display as shown below:

Ensure that the operating lever on the socket is in the open (i.e. up)

position before inserting the IC. Close the socket by lowering the lever,

making sure that the IC is firmly seated in the socket and making good

contact. Press the TEST/EXEC key to activate the test sequence for the

IC. If an invalid IC type number was entered, or if the IC you have

requested is not supported the message "Unknown" will be displayed.

Simply entering another IC type number will automatically clear this error

message. If a valid type number was entered, the IC test will begin and

the message "BUSY" will be displayed while the test proceeds. Many of

the tests, however, execute so quickly that this message is not

noticeable.

8. test results

A pre-determined sequence of signals is applied to the inputs of the IC

and the IC outputs are monitored for the correct logic levels. The unit

uses TTL or CMOS logic thresholds (depending on the selected IC)

when evaluating the response of the IC outputs. If all the outputs

respond correctly, the result PASS will be displayed at the top right of the

display. A scrolling message will contain the IC function and power pin

information.

If a short circuit between the power pins of the IC is detected, a warning

‘SHT!' will appear on the top right of the display and, since no valid test







ChipMaster Compact Digital IC Tester

Page 5

is then possible, the result will FAIL. If the IC under test takes an

excessive amount of current when power is applied, a warning 'ICC!' will

appear. Press the TEST/EXEC key to continue with the test, or

MODE/CLEAR to abandon. Depending on the condition of the batteries

there may also be a ‘BAT!’ warning which indicates that the batteries are

incapable of supplying the current required by the IC under test. You

can continue with the test by pressing the TEST/EXEC key, but the unit

may malfunction because of a drop in battery voltage. To avoid this,

change the batteries or use a battery eliminator. Note that a faulty IC

may demand more operating current and therefore will quickly drain the

batteries.

In the case of a FAIL result, the error conditions at all the non-functional

pins of the IC will be scrolled on the display, and the IC function will be

shown. The various failure conditions that can be displayed are as

follows:

LOW - the output was LOW when HIGH was expected.

MID LOW - the output was LOW, but not a valid logic level.

HIGH - the output was HIGH when LOW was expected.

MID HIGH - the output was HIGH, but not a valid logic level.

LOAD 0V - the input cannot be driven HIGH.

LOAD 5V - the input cannot be driven LOW.

In some cases, the scrolling test results may include one or more

WARNING indications. These warnings indicate conditions that may

result in an incorrect test result, and are as follows:

D/F - result may be invalid because last self-test failed.

BAT - battery voltage too low during test.

ICC - large current taken by IC under test.

The scrolling message can be cancelled by pressing the MODE/CLEAR

key, or paused by pressing and holding a numeric key. If you want to

test the IC again, press the TEST/EXEC to abandon the scroll and

perform another test.

Before discarding a failed IC check that the correct IC type number was

entered and also check that the IC pins are clean and making good

contact with the test socket. Note that there is no way of stopping a test

once it has commenced, but see the description of loop functions later in

this manual.

ChipMaster Compact Digital IC Tester

Page 6

9. testing further ICs

After a test is completed, the test result will be displayed. To test

another IC of the same type, simply insert the next IC and press the

TEST/EXEC key again. To test a different IC, enter the new IC type

number in the usual way, noticing that pressing the first digit of the new

number automatically clears the previous number from the display.

Remember that the MODE/CLEAR key can be used if an error is made

during the entry of the IC type number.

10. continuous testing

It is possible to test the same IC repeatedly to detect intermittent or

temperature-related faults, or to rapidly test a batch of identical ICs.

There are three types of test loop modes:

Loop - execute a test repeatedly, regardless of the result.

P Loop - execute a test repeatedly, provided the result is PASS.

F Loop - execute a test repeatedly, provided the result was FAIL.

The ChipMaster Compact is configured into one of the loop modes using

the MODE/CLEAR key as described earlier. Insert the IC and press

TEST/EXEC in the usual way to start the continuous test process. The

result of each test is displayed as PASS or FAIL on the top right of the

display. In LOOP mode, this allows a large batch of identical ICs to be

tested, without any action on the part of the operator other than inserting

the IC. When the IC is inserted, sufficient time must be allowed for the

test to take place before the result status is updated, so if in doubt the IC

should be tested in single mode so that the approximate test time can be

determined. It will be found that high throughput can be obtained using

this mode.

To stop any of the test loops, press MODE/CLEAR, but note that the test

in progress is completed before the command is obeyed. The effect of

this is usually unnoticeable, but where the test takes a reasonable time

to execute there will be a delay before the instrument responds to the

MODE/CLEAR key.

Note: Testing high current ICs in loop mode will drain the batteries

quickly, and it is recommended that a battery eliminator is used if

you wish to perform loop tests.

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