
Shenzhen Linshang Technology Co., Ltd.
3/12/2022 Page 2 of 13
I. Product Introduction
The Leeb hardness tester detects hardness based on the Leeb hardness measurement principle and
can measure the hardness of a variety of metal materials. The tester adopts advanced digital probe
technology, digital signal processing is done directly on the probe, which is not easily disturbed and
provides excellent testing accuracy. The probe has a built-in direction sensor, which automatically
compensates for the measurement error in different impact directions. The instrument has a variety of
built-in hardness systems, which can be converted between Leeb (HL), Vickers (HV), Brinell (HB), Shore
(HS), Rockwell (HRA), Rockwell (HRB), Rockwell (HRC) and tensile strength (σb). The instrument can
connect with impact devices D, DL, DC and C.
Impact device D is suitable for assessing the hardness of common metal materials;
Impact device DL is suitable for hardness measurement of slender and narrow grooves, tooth
surfaces and the bottom of inner holes;
Impact device DC is suitable for testing the hardness of inner holes and narrow parts with short size;
Impact device C is ideal for measuring the hardness of surface hardening layers and parts with
small masses or thin thickness with small impact force.
Standards for the product:
GB/T 13794.1 Metallic materials-Leeb hardness test-Part 1: Test method
GB/T 13794.2 Metallic materials-Leeb hardness test-Part 2: Verification and calibration of
hardness tester
GB/T 13794.2 Metallic materials-Leeb hardness test-Part 3: Calibration of reference blocks
GB/T 13794.4 Metallic materials-Leeb hardness test-Part 4: Tables of hardness values conversion
JB/T 9378-2001 Industry standard of Leeb hardness tester
JJG 747-1999 Verification regulation of Leeb hardness tester
II. Parameters
Impact device D/ Impact device DC / Impact device DL/
Impact device C
HL, HV, HB, HS, HRA, HRB, HRC
Impact device D/DC:
HLD: (170-960); HV(83-976); HB(30-651); HRC(17.6-68.5);
HS(26.4-99.5); HRB(13.5-100); HRA(60-85.8)
Impact device DL: