Ossila FACT1 Manuale utente

Ossila SuperFACT User Manual

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CONTENTS

OVERVIEW.......................................................................................................................................................4

SAFETY.............................................................................................................................................................5

SYSTEM COMPONENTS....................................................................................................................................6

EC DECLARATION OF CONFORMITY .................................................................................................................7

SYSTEM SETUP.................................................................................................................................................9

EQUIPMENT SETUP ..........................................................................................................................................10

SUPERFACT SOFTWARE INSTALLATION .................................................................................................................13

MULTIPLEXER MEASUREMENT UNIT..............................................................................................................16

FRONT PANEL &SUBSTRATE PLACEMENT...............................................................................................................16

BACK PANEL ..................................................................................................................................................19

SAFETY/OPERATIONAL CONSIDERATIONS ...............................................................................................................20

SPECIFICATIONS ..............................................................................................................................................22

NI 6501 OEM OUTPUTS..................................................................................................................................22

DIGITAL DIO LINES..........................................................................................................................................25

STRESS-BIASED MEASUREMENT .........................................................................................................................27

HARDWARE CONFIGURATION .......................................................................................................................29

OPERATION MODE.........................................................................................................................................31

ACQUISITION MODE ......................................................................................................................................32

A BRIEF INTRODUCTION TO FIELD EFFECT TRANSISTORS ...............................................................................33

OUTPUT CHARACTERISTIC (I-V) ..........................................................................................................................35

TRANSFER CHARACTERISTIC (TC).........................................................................................................................36

GATE-DEPENDENT MOBILITY ..............................................................................................................................38

TRANSFER CHARACTERISTIC CURVES:IDEAL AND REAL BEHAVIOUR ...............................................................................39

THRESHOLD VOLTAGE:SECOND DERIVATIVE METHOD ...............................................................................................40

FIGURES OF MERIT ..........................................................................................................................................41

WELL-BEHAVED TRANSISTOR AND VALIDATION OF THE FIGURES OF MERIT......................................................................42

QUICK START .................................................................................................................................................43

DATA ANALYSIS ..............................................................................................................................................48

SAVE EXPERIMENT SETTINGS ..............................................................................................................................49

DELETE AN EXISTING EXPERIMENT .......................................................................................................................49

COMMIT AN EXPERIMENT..................................................................................................................................49

START AN ACQUISITION ....................................................................................................................................50

CHECK CURRENT EXPERIMENT AND MODIFY DEFAULT ADVANCED SETTINGS ...................................................................50

SUPERFACT UI FRONT PANELS .......................................................................................................................51

ADVANCED SMU AND ACQUISITION SETTINGS........................................................................................................51

SELECT DEVICES TO MEASURE AND MEASUREMENT TYPE UI .......................................................................................55

MEASUREMENT SETTINGS AND DEVICE PARAMETERS................................................................................................60

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LIFETIME AND STRESS BIASED ACQUISITION..................................................................................................72

STRESS BIASED ACQUISITION ..............................................................................................................................72

LIFETIME ACQUISITION .....................................................................................................................................72

MOBILITY COMPUTATION .............................................................................................................................74

LINEAR FIT METHOD.........................................................................................................................................74

DERIVATIVE METHOD .......................................................................................................................................74

PARTITION METHOD ........................................................................................................................................75

MOBILITY ALGORITHMS:INTERVAL OF VALIDITY,ISSUES AND CAVEATS ..........................................................................77

MEASUREMENT AND ACCURACY...................................................................................................................86

TEMPERATURE AND SELF-CALIBRATION .................................................................................................................86

CALCULATION OF THE MEASUREMENT ACCURACY ....................................................................................................86

TEMPERATURE EFFECTS ON SMU ACCURACY .........................................................................................................88

LIST OF SYMBOLS AND ACRONYMS ...............................................................................................................89

SUPERFACT TROUBLESHOOTING....................................................................................................................90

GUIDE TO THE READER: SYMBOLS, ACRONYMS AND COMMON DEFINITIONS...............................................94

WARRANTY INFORMATION AND CONTACT DETAILS......................................................................................95

APPENDICES...................................................................................................................................................96

APPENDIX I-CLEANING ROUTINE .......................................................................................................................96

APPENDIX II -PMMA GATE DIELECTRIC ...............................................................................................................97

APPENDIX III -PEDOT:PSS GATE ROUTINE ..........................................................................................................98

APPENDIX IV -OTS PREPARATION ......................................................................................................................99

APPENDIX V-NOTE ON TRANSIENT TIME ............................................................................................................100

APPENDIX VI -MEASUREMENT FLOWCHART........................................................................................................101

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Overview

The Ossila Fast Automated Characterisation and Test (SuperFACT) system is designed to make

testing and characterisation of organic field effect transistors as simple as possible when combined

with Ossila's FET substrate systems. Fabrication of devices can be as simple as spin-coating a

material on a test-chip and loading it into the system. The automated test routines will then perform

output and/or transfer sweeps and automatically calculate the key OFET/TFT parameters for each of

the twenty devices on the substrate.

SuperFACT multiplexor makes use of a 2D array of gold-coated spring-loaded probes (POGOS) to

connects the devices to the source-meter(s), while the transistor to measure are selected through a

high performance switching network.

At the core of the measurement system is a computer controlled Keithley dual source-measure unit

with maximum output of ±100 V and accuracy up to 10 pA. The Multiplexer Measurement Unit is

highly specified to introduce the minimum amount of distorsion in the measurement as possible.

The resistance introduced in each Drain path is ˂1 Ω, leakage/noise current is ˂500 pA and

capacitance is ˂300 pF. This combined high level of output voltage and accuracy makes for

maximum experimental versatility and speed.

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Safety

Warning

To avoid safety hazards obey the following:

Do not leave devices with applied bias or current unattended as a power failure may result in

board damage or device damage and potentially hazardous situations.

The Ossila Multiplexer Measurement Unit was designed to be used with Drain (Channel B) and

Gate(Channel A) input currents below 100 mA. The Ossila SuperFact Control Software

automatically limits the input currents. Due to this reason there is no fuse in the signal paths to

conserve the accuracy of the measurement. If not using the Ossila SuperFact controlled Software,

ensure the Drain and Gate input signals are limited to 100 mA.

Caution

To avoid damaging devices or equipment obey the following:

Avoid electrostatic discharge (ESD) as this may damage the device. To avoid damage, use static

discharge and prevention equipment where necessary.

Only use the System for the purposes intended (described in this document)

Do not expose the System to any cleaning fluids or solvents.

Ensure that the SMU(s) are not exposed to heat source and are well ventilated to avoid overheating.

Follow good practice when setting up the test system. Avoid placing mobile phones/electrical

devices close to the system as this can cause interference.

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System Components

Keithley 2612B system SMU

Ossila Multiplexer Measurement Unit containing

NI USB-6501 OEM, electronic controls, LED display

and the signal board supporting POGO pin contacts

(probes) for 20 devices and 8 gates.

Desktop PC

(Window®8.1 operative system) endowed with

Core®i7 Intel microprocessors.

24’’ Monitor

Keyboard

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EC Declaration of Conformity

In line with directive 2004/108/EC of the European Parliament and of the Council and directive

2006/95/EC of the European Parliament and of the Council.

Mouse

Two flexible coaxial cables endowed with BNC and

I/O connectors.

One USB® cables with Standard A and Standard B

plugs on the opposite ends.

One GPIB cable with USB connectors

Also included:

Three Power Supply Leads (Cords) for the monitor, computer and the SMU.

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Manufacturer Name: Ossila Limited

Manufacturer Address: Kroto Innovation Centre, North Campus, Broad Lane, Sheffield, S3 7HQ

Item: OFET testing rig for use with PXI system

Model number: SuperFACT1

Software release: Super FACT v1.0

Specifications of product under harmonised standards:

2004/108/EC

EN 61326-1:2006 Electrical equipment for measurement, control and laboratory use –EMC

requirements –Part 1: General requirements IEC 61326-1:2005

EN 61326-2-1:2006 Electrical equipment for measurement, control and laboratory use –EMC

requirements –Part 2-1: Particular requirements –Test configurations, operational conditions and

performance criteria for sensitive test and measurement equipment for EMC unprotected

applications IEC 61326-2-1:2005

2006/95/EC

EN 61010-1:2010 Safety requirements for electrical equipment for measurement, control, and

laboratory use - Part 1: General requirements IEC 61010-1:2010

EN 61010-2-030:2010 Safety requirements for electrical equipment for measurement, control, and

laboratory use - Part 2-030: Particular requirements for testing and measuring circuits IEC 61010-2-

030:2010

EN 61140:2002 Protection against electric shock - Common aspects for installation and equipment

IEC 61140:2001

EN 61187:1994 Electrical and electronic measuring equipment - Documentation IEC

61187:1993 (Modified)

EN 61010-2-081:2002 Safety requirements for electrical equipment for measurement, control and

laboratory use - Part 2-081: Particular requirements for automatic and semi-automatic laboratory

equipment for analysis and other purposes IEC 61010-2-081:2001

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Declaration:

I hereby declare that the equipment named above has been designed to comply with the relevant

sections of the above referenced specifications. The unit complies with all applicable Essential

Requirements of the Directives.

Signed:

Name: Dr James Kingsley

Date:

System Setup

The Multiplexer Measurement Unit is easy and straightforward to set up. Only a few cable

connections are required to make the system fully operational. Nonetheless, the User must read

carefully the following instructions in order to safely and efficiently exploit the performance and

accuracy of the Ossila Multiplexer Measurement Unit. For explanation purposes, it is assumed the

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source meter being used as a SMU is the Keithley source-meter model 2612B. The system is

compatible with Keithley 26XX double channel SMU and NI-PXI 4132.

The system is composed of the following parts:

Ossila Multiplexer Measurement Unit containing signal board with twenty probes and eight

gates, NI USB-6501 OEM, and control and LED display electronics.

Keithley 2612B.

GBIP-USB-HS+

Two flexible coaxial cables endowed with SMU I/O Connector.

One USB® cables with Standard A and Standard B plugs on the opposite ends.

Before starting to assemble the components, make sure that the cables and connections do not

present any damage or alteration that can compromise the safety of the personnel in charge of the

measurement unit and/or affect the performance of the device. In addition, you must read the

Keithley 2612B System SMU manuals first, which are provided with the SMU, with particular

reference to the Safety information.

Do not operate any third party devices outside the operational range specified by their respective

manufacturers. Ossila must not be held responsible for any injury or damage due to the non strict

observance of the guideline outlined in the User Manuals of any third party equipment provided as

part of SuperFACT.

Equipment setup

1) With all the devices switched off, place the components used with the Multiplexer

Measurement Unit. In order to achieve high precision measurement, it is important to

reduce any source of electromagnetic interference: avoid operating the system with a

mobile phone or any other electronic devices in the proximity of the SMU and Ossila

Multiplexer Measurement Unit; maximise the distance between the measurement units

(SMU and Ossila Multiplexer) and the computer case.

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