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HP References in this Manual

This manual may contain references to HP or Hewlett-Packard. Please note that

Hewlett-Packard's former test and measurement, semiconductor products and

chemical analysis businesses are now part of Agilent Technologies. We have

made no changes to this manual copy. In other documentation, to reduce

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the company name prefix: where a product number/name was HP XXXX the

current name/number is now Agilent XXXX. For example, model number

HP8648A is now model number Agilent 8648A.

Service Guide

(

HP 1660EIESIEP-Series

Logic Analyzers

Service Guide

Publication munber 01660-97030

First edition, November 1998

For Safety information, Warranties,

and

Regulatory

information, see

the

pages

the

end

the

book.

©Copyright Hewlett-Packard Company 1987-1998

All

Rights Reserved.

HP 1660E/ESIEP-Series

Logic Analyzers

" l

...

1660E-Series, HP 1660ES-Series, and

1660EP-Series Logic Analyzers

The

1660E-series

are

100-MHz State/500 MHz Timing logic analyzers.

The

1660ES-series

includes

all

the

features

the

1660E-series, as well as a

2-channel, 2GSa/s oscilloscope.

The

1660EP-series

includes

all

the

features

the

1660E-series, as well as a

32-channel

pattern

generator.

Features

Some of

the

main

features of

the

HP 1660E-series logic analyzers are as follows:

•130

data

channels

and

clock/data

channels

the

1660E

•96

data

channels

and

clock/data

channels

the

1661E

•64

data

channels

and

clock/data

channels

the

1662E

•32

data

channels

and

clock/data

channels

the

1663E

•3.5-inchflexible

disk

drive

•2.3 GB

hard

disk

drive

•HP-IE, R8-232-C,

and

Centronics

printer

interfaces

•Variable

setuplhold

time

•

memory

all

channels

with

half

channel

mode

•

Marker

measurements

•12 levels

trigger

sequencing

for

state

and

10 levels

sequential triggering

for

timing

•100 MHz

time

and

number-of-states

tagging

• .

Full

programmability

•

DINrhouse

•DIN

keyboard

support

The

1660EP-series logic analyzers also

include

the

following features:

•15

output

channels

200 MHz

•32

output

channels

100 MHz

•

Memory

depth

258,048

vectors

•

Support

for

TTL, 3-stateTTU3.3v,

3-state

TTUCMOS, ECLterminated, ECL

unterrninated,

and

differential ECL

(without

pod).

The

1660ES-series logic analyzers also include the following features:

• 2 GSa/s digitizing

for

500

MHz

bandwidth

single

shot

oscilloscope

•32768

samples

per

channel

•

Automatic

pulse

parameters

displays

time

between

markers,

acquires until specified

time

between

markers

captured,

performs

statistical

analysis

on time

between

markers

•Lightweight

miniprobes

Service

Strategy

The

service

strategy

for this

instrument

the

replacement

defective assemblies.

This service guide contains information for finding adefective assembly by testing

and

servicing

the

HP 1660EIESIEP-series logic analyzers.

This logic analyzer

can

returned

Hewlett-Packardfor all service work, including

troubleshooting.

Contact

your

nearest

Hewlett-Packard Sales Office for more details.

01660E24

The

1660-series

logic

analyzer

:.i\

;

iii

This

Book

This book is

the

service guide for

the

HP 1660EIESIEP-series logic analyzers

and

is divided

into eight chapters.

Chapter 1contains information about

the

logic analyzer and includes accessories,

specifications

and

characteristics,

and

equipment required for servicing.

Chapter 2tells how to prepare

the

logic analyzer for use.

Chapter 3gives instructions on how to

test

the

performance of

the

logic analyzer.

Chapter

4contains calibration instructions for

the

logic analyzer.

Chapter

5contains self-tests

and

flowcharts for troubleshooting

the

logic analyzer.

Chapter 6tells how to replace assemblies of

the

logic analyzer

and

how to

return

them

Hewlett-Packard.

Chapter 7lists replaceable parts, shows an explodedview,

and

gives ordering information.

Chapter 8explains how

the

logic analyzer works

and

what

the

self-tests

are

checking.

Table

Contents

1General

Information

Accessories

1-2

Specifications (logic analyzer) 1-3

Specifications (oscilloscope)

1-4

Specifications (pattern generator) 1-4

Characteristics (logic analyzer) 1-5

Characteristics (oscilloscope) 1-5

Characteristics (pattern generator) 1-6

Recommended test equipment (logic analyzer) 1-9

Recommended

test

equipment (oscilloscope) 1-10

Recommended

test

equipment (pattern generator) 1-11

2Preparing

for

Use

inspect

the

logic analyzer

2-2

apply power 2-3

operate the user interface 2-3

set

the

line voltage 2-3

clean the logic analyzer 2-4

test the logic analyzer

2-4

Testing

Performance

perform

the

self-tests

3-2

make

the

test

connectors

(logic

analyzer)

3-7

test

the

threshold

accuracy

(logic

analyzer)

3-9

Set up the equipment

3-9

Set up the logic analyzer 3-10

Connect the logic analyzer 3-10

Test the TTL threshold

3-11

Test the

ECL

threshold 3-13

Test the-User threshold 3-14

Test the +User threshold 3-15

Test the 0 VUser threshold

3-16

Test the next pod

3-17

test

the

glitch

capture

(logic analyzer)

3-18

Setup

the equipment 3-18

Set up the logic analyzer 3-19

Connect the logic analyzer

3-19

Testthe glitch capture on the connected channels 3-21

Testthe next channels 3-23

test

the

single-clock, single-edge,

state

acquisition

(logic

analyzer)

3-24

Set up the equipment

3-24

Set up the logic analyzer 3-25

Contents

Connect the logic analyzer

3-27

Verify

the test signal 3-29

Check the setup/hold combination 3-31

Test

the

next channels 3-36

test

the

multiple-clock,

multiple-edge,

state

acquisition

(logic

analyzer)

3-37

Set up the equipment 3-37

Set up the logic analyzer 3-38

Connect the logic analyzer 3-40

Verify the test signal 3-42

Check

the

setup/hold with single clock edges, multiple clocks

3-44

Test the next channels 3-48

test

the

single-clock,

multiple-edge,

state

acquisition

(logic

analyzer)

3-49

Set up the equipment 3-49

Set up the logic analyzer 3-50

Connect the logic analyzer 3-52

Verify

the test signal 3-54

Check the setup/hold with single clock, multiple clock edges

3-56

Test

the

next channels 3-59

test

the

time

interval

accuracy

(logic

analyzer)

3-60

Set up the equipment 3-60

Set up the logic analyzer 3-61

Connect the logic analyzer 3-64

Acquire the data 3-64

test

the

CAL OUTPUT

ports

(

oscilloscope)

3-65

Set up the equipment 3-65

Set up the logic analyzer 3-66

Verify the

CAL

OUTPUT

port

3-67

Set up the logic analyzer 3-68

Verify

the

CAL

OUTPUT port

3-68

test

the

input

resistance

(oscilloscope)

3-69

Set up the equipment 3-69

Set up the logic analyzer 3-70

Connect the logic analyzer 3-71

Acquire the data 3-72

Perform

operational

accuracy

calibration

3-72

test

the

voltage

measurement

accuracy

(oscilloscope)

3-73

Set up the equipment 3-73

Set up the logic analyzer 3-74

Connect the logic analyzer 3-75

Acquire the data 3-76

test

the

offset

accuracy

(oscilloscope)

3-77

Set

the

equipment

3-77

Set

the

logic analyzer 3-78

Connect the logic analyzer 3-79

Acquire

the

zero input

data

3-80

Acquire

the

input

data

3-81

test

the

bandwidth

(oscilloscope)

3-82

Set up

the

equipment 3-82

Set up

the

logic analyzer 3-83

Connect the logic analyzer 3-85

Acquire

the

data

3-86

test

the

time

measurement

accuracy

(oscilloscope)

3-87

Set up

the

equipment

3-87

Set up

the

logic analyzer 3-88

Connect

the

logic analyzer 3-90

Acquire

the

data

3-90

test

the

trigger

sensitivity

(oscilloscope)

3-91

Set

the

equipment 3-91

Set

the

logic analyzer 3-92

Connect the logic analyzer 3-94

Acquire

the

data

3-94

Performance

Test

Record

(logic

analyzer)

3-95

Performance

Test

Record

(oscilloscope)

3-101

Performance

Test

Record

(pattern

generator)

3-104

Calibrating

and

Adjusting

Logic

analyzer calibration 4-2

calibrate

the

oscilloscope

4-3

Set

the

equipment

4-3

Load

the

Default Calibration Factors

4-4

Self

Cal

menu calibrations 4-5

Troubleshooting

use the flowcharts

5-2

check the power-up

tests

5-17

the

self-tests

5-18

test

the

power supply voltages 5-24

test

the

LCD

display signals 5-26

test

the

keyboard signals 5-27

test

the

flexible disk drive voltages 5-28

test

the hard disk drive voltages 5-30

Contents

vii

Contents

perform

the

BNC

test

5-31

test

the

logic analyzer probe cables 5-32

verify pattern

output

(HP 1660EP-series only) 5-36

The

Ether

address

5-38

test

the

auxiliary

power

5-39

Replacing

Assemblies

remove and replace

the

handle 6-5

remove

and

replace

the

feet and tilt stand 6-5

remove and replace

the

cover 6-5

remove

and

replace

the

disk

drive assembly 6-6

remove and replace

the

power supply

6-7

remove

and

replace

the

CPU

board

6-7

remove

and

replace

SIMM

memory 6-9

remove

and

replace

the

switch actuator assembly 6-10

remove

and

replace

the

rear panel assembly 6-11

remove and replace

the

1660E-series acquisition board 6-12

remove and replace

the

1660ES-series oscilloscope board 6-13

remove and replace

the

1660EP-series

pattern

generatorboard 6-14

remove and replace

the

front panel and keyboard 6-15

remove and replace

the

LCD

display 6-16

remove and replace

the

handle plate 6-17

remove and replace

the

fan

6-18

remove

and

replace

the

line filter 6-18

remove

and

replace

the

1660EP-series

pattern

generator cables 6-19

remove

and

replace

the

HP-IB

and RS-232-C cables 6-19

remove

and

replace

the

JlO

board 6-20

return

assemblies 6-20

Replaceable

Parts

Replaceable

Parts

Ordering 7-2

Replaceable

Parts

List 7-3

Exploded View

7-4

Power Cables

and

Plug

Configurations 7-8

Theory

Operation

Block-Level

Theory

8-3

The HP 1660EIESIEP-Series

Logic

Analyzer

8-3

The Logic Acquisition Board

8-7

The Oscilloscope

Board

8-10

The

Pattern

Generator Board 8-13

Self-Tests

Description

8-15

Power-up Self-Tests

8-15

System Tests

(System

PV) 8-16

Analyzer Tests (Analy PV) 8-20

Oscilloscope

tests

(Scope

PV)

8-22

Pattern

Generator

tests

(Patt Gen) 8-23

viii

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