SPECTRO XEP05 Manuale utente
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SPECTRO XEPOS
Benchtop XRF Spectrometer
Original operating instructions
SPECTRO XEPOS — 19.01.2017 — 3
Table of Contents
1Description of instrument ....................................................................................5
1.1Description .......................................................................................................................... 5
1.2Function .............................................................................................................................. 5
1.3Overview ............................................................................................................................. 6
1.3.1Configuration ......................................................................................................... 6
1.3.2Instrument (front) ................................................................................................... 7
Opening and closing the sample chamber lid ....................................................... 8
1.3.3Instrument (back)................................................................................................... 9
1.3.4Sample chamber ................................................................................................. 10
1.3.5Sample chamber - additional components.......................................................... 11
1.3.6Sample tray ......................................................................................................... 11
2Safety................................................................................................................12
2.1Symbols used ................................................................................................................... 12
2.2User information................................................................................................................ 13
2.3Intended use ..................................................................................................................... 13
2.4Prohibited operating conditions ........................................................................................ 14
2.5Residual risks.................................................................................................................... 14
2.6Radiation protection advice .............................................................................................. 16
2.6.1Other countries .................................................................................................... 16
3Technical data...................................................................................................17
4Transportation/Setting-up .................................................................................18
4.1Storage ............................................................................................................................. 19
4.2Gas supply (optional)........................................................................................................ 19
4.3Vacuum (option)................................................................................................................ 20
4.4Uninterruptible power supply – UPS (option) ................................................................... 21
5Operation ..........................................................................................................23
5.1Displays ............................................................................................................................ 23
5.1.1Screen – Routine dialog ...................................................................................... 23
5.1.2Beam Stop display on the instrument.................................................................. 24
5.2Switching on the instrument.............................................................................................. 25
5.3Proceed with the start-up test ........................................................................................... 27
5.3.1Checking the safety circuits on the sample chamber lid ..................................... 27
5.3.2Checking the safety circuit on the filter changer ("Beam Stop").......................... 28
5.3.3Initialization of the stepping motors ..................................................................... 29
5.3.4Automatic verification of the safety circuits after one month ............................... 30
5.4Switching off the instrument.............................................................................................. 31
5.5Standby mode................................................................................................................... 32
5.6Measuring procedure........................................................................................................ 33
5.6.1Preparing the measuring procedure.................................................................... 33
How to measure different samples...................................................................... 34
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How to measure cuvettes (powder or liquid) ....................................................... 34
How to measure powder pallets .......................................................................... 35
How to measure glass or melting pellets............................................................. 35
How to measure large samples ........................................................................... 36
5.6.2Proceed with the measurement ........................................................................... 37
How to change/remove the sample tray .............................................................. 38
5.7Dust protection shutter / beam stabilization vacuum shutter (option)............................... 39
Dust protection shutter......................................................................................... 39
Beam stabilization vacuum shutter...................................................................... 39
6Maintenance by the operator............................................................................ 40
6.1Operator maintenance plan............................................................................................... 40
6.2Energy channel recalibration (MCA) ................................................................................. 42
6.3Standardization (Global recalibration)............................................................................... 43
6.4Clean the sample tray ....................................................................................................... 44
6.5Clean the sample chamber ............................................................................................... 44
6.6Replacing the adhesive film in the discharge reservoir .................................................... 45
6.7Replacing the tray pads .................................................................................................... 46
6.8Insert the film for the "liquid protect" sample cup.............................................................. 47
6.9Replacing the filter mat ..................................................................................................... 49
6.10Dust protection shutter / beam stabilization vacuum shutter (option) — Clean O-ring..... 50
6.11Troubleshooting ................................................................................................................ 51
7Spare parts and consumables.......................................................................... 55
8De-commissioning............................................................................................ 55
9Manufacturer address ...................................................................................... 55
10EC Declaration of Conformity........................................................................... 56
Description of instrument
SPECTRO XEPOS — 19.01.2017 — 5
1 Description of instrument
1.1 Description
Designation: SPECTRO XEPOS
Model: XEP05
Type: 76004852
1.2 Function
X-rays excite the atoms of the sample, causing them to emit radiation. This
radiation is measured by a semiconductor detector.
To achieve a higher sensitivity, the exciting radiation can be optimized by using X-
ray optical elements or filters.
The instrument comes with a prepared analysis method. Data are already stored
in the instrument's memory. The measured values are compared with these data.
After the measurement is complete, the results of a sample relating to an unknown
composition are displayed on the screen.
The sample material may be solid, liquid or in powder form, see Chapter "How to
measure different samples".
Description of instrument
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1.3 Overview
1.3.1 Configuration
The instrument is available in various configurations. Depending on the
application/requirement, the instrument is equipped with the following X-ray optics:
Direct excitation
Direct excitation and single polarization channel
Direct excitation and dual polarization channel
Depending on the application / requirement, the following expansions are
available:
Sample spinner
Helium flushing
Vacuum pump
Active pile-up suppression
Dust protection shutter / beam stabilization vacuum shutter
Description of instrument
SPECTRO XEPOS — 19.01.2017 — 7
1.3.2 Instrument (front)
Fig. 1: Front view
No. Component
1 Sample chamber lid
2 Ventilation slots with filter mat
3 Beam stop display Open/closed (Open = red/closed = green)
X-ray display On/Off (On = orange/Off = off),
see also Chapter 5.1.2.
1
2
3
3
Description of instrument
— 8 SPECTRO XEPOS — 19.01.2017
Opening and closing the sample chamber lid
Caution! Risk of crushing injuries!
When closing the sample chamber lid, there is an inherent risk of crushing injuries.
When closing the sample chamber lid keep the fingers out of the sample
chamber.
Fig. 2
No. View
1 Sample chamber lid closed
2 Sample chamber lid open
When pressing slightly against the handle, the sample chamber lid can be pushed
back and locked into place. In order to open the cover, slightly press against the
handle and pull on the sample chamber lid.
12
Description of instrument
SPECTRO XEPOS — 19.01.2017 — 9
1.3.3 Instrument (back)
Fig. 3: Rear view
No. Component No. Component
1 Type plate with serial number,
date of production, max.
parameters of the X-ray tube
5 Power supply connection for
vacuum pump (1000 W max.)
2 PC/Ethernet conviction (using the
LAN cable included in delivery)
6 Power In (max. 1200 W)
3 Helium supply line connection 7 Key-operated switch On/Off
4 Vacuum hose connection
Note
Set up the instrument to ensure the power isolators (switches and power cable)
can be easily reached.
1
3
2
45
67
Description of instrument
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1.3.4 Sample chamber
Fig. 4
No. Component
1 Sample tray locking device
2 Sample tray (different models available)
3 Analysis position (position of the sample during the measurement)
4 Tray handle
5 Tray screw
1
4
2
3
5
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